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111
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1 /* { dg-do compile } */
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2 /* { dg-options "-O2 -fdump-tree-reassoc1" } */
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3
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4 /* We want to make sure that we reassociate in a way that has the
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5 constant last. With the constant last, it's more likely to result
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6 in a bitfield test on targets with such capabilities. */
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7
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8 extern void boo ();
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9
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10 int b2b_uc (unsigned char u, unsigned char w)
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11 {
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12 if ((u & w) & 0x20)
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13 boo ();
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14 }
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15
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16 int b2b_us (unsigned short u, unsigned short w)
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17 {
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18 if ((u & w) & 0x20)
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19 boo ();
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20 }
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21
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22 int b2b_ui (unsigned int u, unsigned int w)
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23 {
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24 if ((u & w) & 0x20)
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25 boo ();
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26 }
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27 int b2b_ul (unsigned long u, unsigned long w)
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28 {
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29 if ((u & w) & 0x20)
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30 boo ();
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31 }
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32 int b2b_ull (unsigned long long u, unsigned long long w)
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33 {
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34 if ((u & w) & 0x20)
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35 boo ();
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36 }
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37
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38 int b2b_sc (signed char u, signed char w)
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39 {
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40 if ((u & w) & 0x20)
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41 boo ();
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42 }
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43
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44 int b2b_ss (signed short u, signed short w)
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45 {
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46 if ((u & w) & 0x20)
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47 boo ();
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48 }
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49
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50 int b2b_si (signed int u, signed int w)
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51 {
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52 if ((u & w) & 0x20)
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53 boo ();
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54 }
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55 int b2b_sl (signed long u, signed long w)
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56 {
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57 if ((u & w) & 0x20)
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58 boo ();
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59 }
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60 int b2b_sll (signed long long u, signed long long w)
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61 {
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62 if ((u & w) & 0x20)
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63 boo ();
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64 }
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65
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66 /* The AND of U & W should go into a temporary, when is then ANDed
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67 with the constant.
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68
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69 First verify that we have the right number of ANDs between U and W. */
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70 /* { dg-final { scan-tree-dump-times "\[uw\]_\[0-9\]+.D. \& \[uw\]_\[0-9\]+.D.;" 10 "reassoc1"} } */
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71
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72 /* Then verify that we have the right number of ANDS between a temporary
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73 and the constant. */
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74 /* { dg-final { scan-tree-dump-times "_\[0-9]+ \& 32;" 10 "reassoc1"} } */
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75
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76 /* Each function has one AND. It will have either a second AND or TEST. So
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77 we can count the number of AND and TEST instructions. They must be 2X
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78 the number of test functions in this file. */
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79 /* { dg-final { scan-assembler-times "and|test" 20 { target { i?86-*-* x86_64-*-*} } } } */
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80
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81 /* Similarly on the m68k. The code for the long long tests is suboptimal,
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82 which catch via the second pattern and xfail. */
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83 /* { dg-final { scan-assembler-times "and|btst" 20 { target { m68k-*-* } } } } */
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84 /* { dg-final { scan-assembler-not "or" { target { m68k-*-* } xfail { *-*-* } } } } */
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85
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